Last news
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> Post the 31 October 2011
Microwave Journal Interview at EuMW 2011
David Vye, Technical Editor at the Microwave Journal spent some time with Steve Dudkiewicz, Maury’s Director of Business Development, at European Microwave in Manchester this year. They discussed Maury’s partnerships with AMCAD Engineering and Anteverta Microwave, and new product releases.
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> Post the 10 October 2011
AMCAD to Demonstrate STAN Tool for Microwave Circuit Stability Analysis
AMCAD Engineering is showing its newest automated stability analysis tool for RF and microwave circuit designers at European Microwave Week (Stand 523), October 11 to 13, Manchester Central, Manchester, England.
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> Post the 1 June 2011
AMCAD Engineering Announces STAN tool for circuit stability analysis
AMCAD Engineering, a supplier of new RF & Microwave solutions for advanced design, announced today STAN tool, an automated stability analysis tool for RF & Microwave circuit designers.
New PIV Specifications
The Pulse IV system is now available with 5 different drain probe heads. The latest 200mA probe head is now dedicated to pulsed measurement of small transistors (FETs & HBTs) where high measurement accuracy is needed.
Maury Microwave and AMCAD Engineering Announce a Development and Distribution Partnership for Advanced Measurement and Modeling Software and Pulsed IV Systems
Maury Microwave Corporation and AMCAD Engineering have signed an exclusive development and distribution agreement with regards to AMCAD’s advanced measurement suite, IVCAD, and its PIV/PLP family of pulsed IV systems
GaN FET Modeling Tool Main Features
AMCAD’ original FET model is a measurement-based analytical model developed for the purpose of fitting measured electrical behavior of FETs.
Wafer Mapping
This IVCAD plug-in allows users to create a visual display of test data, showing parameters distribution on a wafer map.
