AMCAD Engineering
Customers



This IVCAD plug-in allows users to create a visual display of test data, showing parameters distribution on a wafer map.

AMCAD’ pulsed IV/ RF characterization system can control a semi-automatic prober, allowing to rapidly and automaticly characterize a entire wafer.

Wafer-mapping the DC/ RF parameters allows process variations to be plotted across the wafer and better understood.

 

Video below shows how to use this wafer mapping plugin to display Idss distribution on a wafer map, and to highlight trapping effects distribution (gate lag and drain lag).

 

 

 

 (5 minutes Flash Video)