> Post the 31 May 2011
Live Demo
Pulsed IV/ pulsed RF Measurement System
- On high-power GaN device with AMCAD PIV characterization system and Agilent PNA-X, driven by IVCAD software. Professional, industry-proven pulsing technology for both standalone IV-testing as well as pulsed-bias load-pull applications.
- STAN Tool for internal linear and non-linear stability analysis, based on Pole-Zero identification principle
- FET Modeling plug-in to extract accurate linear and non-linear compact measurement based models
- Volterra Modeling plugin for system level behavioral modeling
- Modern and Intuitive Data Visualization for IV, S-Parameters and Load-Pull Data
Presentations Schedule
Additionally, AMCAD will also present:
- Tuesday, June 7 – 3:20pm – TU3E “A New Multi-Harmonic Volterra Model Dedicated to GaN Packaged Transistor or SSPA for Pulse Application”, W. Demenitroux
- Tuesday, June 7 – 3:30pm – MicroApps “STAN Tool: A New Method for Linear and Nonlinear Stability Analysis of Microwave Circuits”, S. Dellier
Partners
- Maury Microwave, your complete Measurement Solutions Partner will be on booth #1016.
- VTD on booth #318 will demo pulsed time domain LoadPull measurements with SWAP-X402 NVNA and AMCAD PIV generator driven by IVCAD software.
See You !
We look forward to discussing your needs and offering you our unique solutions when you drop by Stand #714
ARFTG
AMCAD will also exhibit during ARFTG conference on Friday June 10th, 2011 - Baltimore, Maryland
—