Device Characterization Seminar Tour 2011

Dear valued Component Characterization Engineer,

We cordially invite you to our spring 2011 seminar tour on 18 and 19 may 2011. Together with our partners we present a full day program on topics in the field of device characterization for model purposes and model verification or simply to feed your simulator with data for first-time-right designs! Learn all about
- DC-IV characterization, both puised and CW,
- S-parameter measurements, both puised and CW,
- noise parameters,
- active, passive and hybrid load-pull,
- signal integrity,
- etc.
The seminar consists of presentations and includes many live demonstrations on the equipment presented. Specialists from our Partners will be present and available to answer your questions.
We have stops in Delft and Eindhoven at first class locations where we serve coffee, refreshments and lunch. At each location we have a sneaky view into the local lab: the HF-Lab frorn DIMES in Delft and MiPlaza in Eindhoven. We hope to see you soon!

Contact info@bsw-bc.nl for inscription

Bsw TestSystems and Consuiting AG/bv